1. Análise de Filmes Finos

1.1. Difração Coplanar

In a coplanar experiment, the source and detector increase their angle relative to the sample surface resulting in a probing direction into the sample surface.

• Grazing Incidence Diffraction (GID) for surface sensitive identification of crystalline phases and determination of their structural properties including crystallite size and strain.
• X-ray reflectometry (XRR) for the extraction of thicknesses, material densities and interface structures in multi-layer samples – from simple substrates to highly complex superlattice structures.
• Grazing Incidence Small Angle X-Ray Scattering (GISAXS)

1.2. Difração Não-Coplanar

In a non-coplanar experiment, the source and detector angle relative to the sample surface is fixed, with the detector moving in a direction parallel to the sample surface resulting in a probing direction along the sample surface.

• In-Plane Grazing Incidence Diffraction (IPGID) reduces the penetration depth to nm, allowing surface isolation and increase sensitivity to layers with atomic thicknesses.
• Polycrystalline IPGID allows the determination of in-plane crystallite size
• Epitaxial IPGID allows direct determination of in-plane lattice parameters and in-plane orientation.